Yu Weiping, Duan Shuzhen. Dependence of Structure Stability of Electrodepositing Amorphous Cr-C and Ni-P on C,P Contents[J]. Chinese Journal of Engineering, 1996, 18(S2): 64-68. DOI: 10.13374/j.issn1001-053x.1996.s2.014
Citation: Yu Weiping, Duan Shuzhen. Dependence of Structure Stability of Electrodepositing Amorphous Cr-C and Ni-P on C,P Contents[J]. Chinese Journal of Engineering, 1996, 18(S2): 64-68. DOI: 10.13374/j.issn1001-053x.1996.s2.014

Dependence of Structure Stability of Electrodepositing Amorphous Cr-C and Ni-P on C,P Contents

  • The dependence of structure stability of electrodepositing amorphous Cr-C and Ni-P films on their components have been researched by action of high accelerated voltage electronic cluster. It was shown that, when temperature was far lower than crystalline temperature, the lower the content of submetallic element in films,the bigger the extent to crystallize.
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