樊自拴, 凌燕平, 李文超. 单晶硅氧化动力学及氧化膜结构分析[J]. 工程科学学报, 1987, 9(3): 107-113. DOI: 10.13374/j.issn1001-053x.1987.03.035
引用本文: 樊自拴, 凌燕平, 李文超. 单晶硅氧化动力学及氧化膜结构分析[J]. 工程科学学报, 1987, 9(3): 107-113. DOI: 10.13374/j.issn1001-053x.1987.03.035
Fan Zishuan, Ling Yanping, Li Wenchao. Oxidation Kinetics of Silicon-monocrystal and Microstructufe of Oxide Fil[J]. Chinese Journal of Engineering, 1987, 9(3): 107-113. DOI: 10.13374/j.issn1001-053x.1987.03.035
Citation: Fan Zishuan, Ling Yanping, Li Wenchao. Oxidation Kinetics of Silicon-monocrystal and Microstructufe of Oxide Fil[J]. Chinese Journal of Engineering, 1987, 9(3): 107-113. DOI: 10.13374/j.issn1001-053x.1987.03.035

单晶硅氧化动力学及氧化膜结构分析

Oxidation Kinetics of Silicon-monocrystal and Microstructufe of Oxide Fil

  • 摘要: 用气固相反应原理分析了单晶硅热氧化机理。在氧化中期,考虑到热应力对扩散系数的影响,从而得出了硅氧化的一个新模型,即化学反应控速——四次方混合控速——扩散控速模型。用该模型处理了文献4中的数据与本实验结果均得到满意的相关系数。另外,用扫描电镜和透射电镜对氧化膜进行了观察,分析了单晶硅的氧化膜生长机理。

     

    Abstract: Oxidation kinetics of siliconmonocrystal have been studied. The three steps rule of gas-solid reaction have been raised. The reaction rate of oxidation is divided into three stages:in the initial period the reaction rate is controlled by interface chemical reaction; in the second stage by both interface chemical reaction and slow diffusion due to stress; in the third stage by diffusion.And the microstructure of oxide film have been observed by SEM and TEM.

     

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