韩敏芳, 王玉倩, 李伯涛, 彭苏萍. 流延成型制备8YSZ电解质薄片及其性能研究[J]. 工程科学学报, 2005, 27(2): 209-212. DOI: 10.13374/j.issn1001-053x.2005.02.051
引用本文: 韩敏芳, 王玉倩, 李伯涛, 彭苏萍. 流延成型制备8YSZ电解质薄片及其性能研究[J]. 工程科学学报, 2005, 27(2): 209-212. DOI: 10.13374/j.issn1001-053x.2005.02.051
HAN Minfang, WANG Yuqian, LI Botao, PENG Suping. Manufacture and properties of 8 YSZ electrolyte thin film by tape casting[J]. Chinese Journal of Engineering, 2005, 27(2): 209-212. DOI: 10.13374/j.issn1001-053x.2005.02.051
Citation: HAN Minfang, WANG Yuqian, LI Botao, PENG Suping. Manufacture and properties of 8 YSZ electrolyte thin film by tape casting[J]. Chinese Journal of Engineering, 2005, 27(2): 209-212. DOI: 10.13374/j.issn1001-053x.2005.02.051

流延成型制备8YSZ电解质薄片及其性能研究

Manufacture and properties of 8 YSZ electrolyte thin film by tape casting

  • 摘要: 探索了以YSZ纳米粉体为原料,采用流延成型的方法制备YSZ电解质薄片的工艺过程,研究了YSZ纳米粉体及流延后坯体的性能,以及通过实验获得的瓷体性能.粉体粒度分布窄,在0.1~0.3μm之间,中位径为0.157μm.坯体在968.9℃开始有明显收缩,在1 279.9℃收缩最快,而在1400℃后,收缩值基本稳定于20%.坯体的致密度良好,相对密度为64.1%,通过烧结得到的瓷体的相对密度可达97.8%,晶粒细密均匀,大小为1-4 μm,晶界明显.YSZ薄片随温度的升高表现出良好的电性能,在900℃时的电导率达0.106 S/cm.

     

    Abstract: YSZ electrolyte thin films were prepared by tape casting from nanocrystalline powder. The properties of YSZ nanocrystalline powder, adobe by tape casting and sintered thin films were analyzed. The YSZ nanocrystalline powder has a narrow size distribution of 0.1-0.2 μm and the median size is 0.157 μm. The beginning shrinkage temperature of the YSZ nano-powder is 968.9℃ from its sintering curve. The highest shrinkage rate appears at 1279.9℃, and by 1400℃ the shrinkage rate is stable, almost up to 20%. The adobe by tape casting has high density and its relative density is up to 64.1%. The relative density of the sintered YSZ thin films is 97.8%. The grain size of YSZ is in the range of 1-4 μm, which show uniform with the microstructure by SEM, as well as grain boundaries are obvious. The YSZ thin films show good electrical properties with increasing temperature and their conductivity is 0.106 S/cm at 900℃.

     

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