Ye Xingpu, Liu Xilin, Zhu Yuankai. The Direct Measurement Method of Conductivity Different Depth Method[J]. Chinese Journal of Engineering, 1984, 6(2): 105-111. DOI: 10.13374/j.issn1001-053x.1984.02.009
Citation: Ye Xingpu, Liu Xilin, Zhu Yuankai. The Direct Measurement Method of Conductivity Different Depth Method[J]. Chinese Journal of Engineering, 1984, 6(2): 105-111. DOI: 10.13374/j.issn1001-053x.1984.02.009

The Direct Measurement Method of Conductivity Different Depth Method

  • By taking the exact size of the conductivity cell as well as the resistance values at diffevent depth, the conductivity was calculated using the following equation:\\beginarrayl\sigma = \frac12\pi \Delta \rmh\rm(\frac\rm1\rmR_\rm2\rm - \frac\rm1\rmR_\rm1\rm)ln(\frac\rmD_\rm2\rm - m\rmD_\rm1\rm - m\rm \bullet \frac\rmr_\rm1\rmr_\rm2\rm)\\\rmor\\\sigma = \frac\rmK^*\Delta \rmh\rm(\frac\rm1\rmR_\rm2\rm - \frac\rm1\rmR_\rm1\rm)\endarray\Therefore, the procedure of demarcating the constant of the conductivity cell by using a know solution can be omitted.With this new mefhod, the experimental procedure has been simplified and the results proved accurate.
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