李华瑞, 孟庆恩, 邸秀萱. 用X线衍射线形分析测定晶粒尺寸及微畸变的傅立叶级数合成方法[J]. 工程科学学报, 1985, 7(1): 66-72. DOI: 10.13374/j.issn1001-053x.1985.01.020
引用本文: 李华瑞, 孟庆恩, 邸秀萱. 用X线衍射线形分析测定晶粒尺寸及微畸变的傅立叶级数合成方法[J]. 工程科学学报, 1985, 7(1): 66-72. DOI: 10.13374/j.issn1001-053x.1985.01.020
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Li Huarui, Meng Qingen, Di Xiuxuan. A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion[J]. Chinese Journal of Engineering, 1985, 7(1): 66-72. DOI: 10.13374/j.issn1001-053x.1985.01.020
Citation: Li Huarui, Meng Qingen, Di Xiuxuan. A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion[J]. Chinese Journal of Engineering, 1985, 7(1): 66-72. DOI: 10.13374/j.issn1001-053x.1985.01.020
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用X线衍射线形分析测定晶粒尺寸及微畸变的傅立叶级数合成方法

A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion

    摘要
  • 摘要: 本文提出了一个采用傅立叶级数合成方法分析X射线衍射线形来确定金属多晶体中晶块尺寸及微畸变的方法。与现存的其它方法相比较,这一方法所做的假设是最少的。

     

    Abstract: This article put forward a Fourier synthesis method of X-ray diffraction profile analysis for determination of grain size and microdistor-tion. Comparing with the, other existing methods, the hypotheses applied in this method is minimum.

     

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