张梅, 刘振祥, 谢侃, 杜雪岩, 李文超. CeO2包覆TiO2的XPS研究[J]. 工程科学学报, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004
引用本文: 张梅, 刘振祥, 谢侃, 杜雪岩, 李文超. CeO2包覆TiO2的XPS研究[J]. 工程科学学报, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004
Zhang Mei, Liu Zhenxiang, Xie Kan, Du Xueyan, Li Wenchao. XPS Study of TiO2 Coated with CeO2 Film[J]. Chinese Journal of Engineering, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004
Citation: Zhang Mei, Liu Zhenxiang, Xie Kan, Du Xueyan, Li Wenchao. XPS Study of TiO2 Coated with CeO2 Film[J]. Chinese Journal of Engineering, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004

CeO2包覆TiO2的XPS研究

XPS Study of TiO2 Coated with CeO2 Film

  • 摘要: 利用光电子能谱XPS研究CeO2包覆TiO2后氧化还原性能.TEM照片证明实验中制备出包覆材料;Ce3d谱线说明加入TiO2后CeO2非常容易还原,吸氧时它能够再氧化.由于CeO2的晶体结构发生畸变,CeO2的活化能降低,有利于氧空位移动,所以CeO2容易还原氧化.

     

    Abstract: Redox capacity of CeO2 coating TiO2 is discussed.It is showed that CeO2 is easy to be reduced and can be re-oxidized while expoursing O2.Due to Ti4+ mixed in the CeO2 lattice, the activation energy decrease, which attributed to oxygen vacancy migration.

     

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