孔为, 苍大强, 宋佳慧. 脉冲电场对取向硅钢磁性能及织构的影响[J]. 工程科学学报, 2011, 33(8): 936-940. DOI: 10.13374/j.issn1001-053x.2011.08.006
引用本文: 孔为, 苍大强, 宋佳慧. 脉冲电场对取向硅钢磁性能及织构的影响[J]. 工程科学学报, 2011, 33(8): 936-940. DOI: 10.13374/j.issn1001-053x.2011.08.006
KONG Wei, CANG Da-qiang, SONG Jia-hui. Effects of pulse electric fields on the magnetic properties and texture of oriented silicon steel[J]. Chinese Journal of Engineering, 2011, 33(8): 936-940. DOI: 10.13374/j.issn1001-053x.2011.08.006
Citation: KONG Wei, CANG Da-qiang, SONG Jia-hui. Effects of pulse electric fields on the magnetic properties and texture of oriented silicon steel[J]. Chinese Journal of Engineering, 2011, 33(8): 936-940. DOI: 10.13374/j.issn1001-053x.2011.08.006

脉冲电场对取向硅钢磁性能及织构的影响

Effects of pulse electric fields on the magnetic properties and texture of oriented silicon steel

  • 摘要: 采用硅钢自动测量装置及X射线衍射仪检测出样品在实验前后的磁性能参数和织构强度.结果表明:较低的电压、9 Hz、较长的处理时间以及退火温度为650℃有利于增高铁损降低比例;较低的电压、较高的频率以及退火温度为650℃有利于增加磁感应强度增高比例.最佳的提高磁性能的实验参数是:频率为9 Hz,电压为500 V,处理时间为6 min,退火温度为650℃.通过织构分析可以验证:取向硅钢磁感应强度的变化取决于110<001>晶粒取向度值,而110<001>取向度值可看成是一个反映总体平均偏离角大小情况的综合值.

     

    Abstract: An automatic measurement system for silicon steel and an X-ray diffraction meter were used for measuring the magnetic property parameters and texture of ex-processed samples and processed samples.It is shown that under the condition of a lower voltage,9Hz,a longer processed time and an annealing temperature of 650℃,the decrease rate of iron loss can be increased;a lower voltage,a higher frequency and an annealing temperature of 650℃ are in favor of improving the increase rate of magnetic induction.The best test parameters for improving the magnetic properties are the frequency of 9Hz,the voltage of 500V,the processing time of 6min and the annealing temperature of 650℃.Through texture analysis,it is verified that the change in magnetic induction of oriented silicon steel depends on the 110 001 orientation degree and the 110 001 orientation degree can be regarded as a comprehensive value which reflects the situation of the overall average angle of divergence.

     

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