付昆昆, 郑百林, 殷永柏, 胡腾越, 叶林, 寿大华. 类金刚石薄膜在锥形纳米压头作用下的断裂分析[J]. 工程科学学报, 2014, 36(2): 206-212. DOI: 10.13374/j.issn1001-053x.2014.02.011
引用本文: 付昆昆, 郑百林, 殷永柏, 胡腾越, 叶林, 寿大华. 类金刚石薄膜在锥形纳米压头作用下的断裂分析[J]. 工程科学学报, 2014, 36(2): 206-212. DOI: 10.13374/j.issn1001-053x.2014.02.011
FU Kun-kun, ZHENG Bai-lin, YIN Yong-bo, HU Teng-yue, YE Lin, SHOU Da-hua. Fracture analysis of diamond-like carbon films under conical nanoindentation[J]. Chinese Journal of Engineering, 2014, 36(2): 206-212. DOI: 10.13374/j.issn1001-053x.2014.02.011
Citation: FU Kun-kun, ZHENG Bai-lin, YIN Yong-bo, HU Teng-yue, YE Lin, SHOU Da-hua. Fracture analysis of diamond-like carbon films under conical nanoindentation[J]. Chinese Journal of Engineering, 2014, 36(2): 206-212. DOI: 10.13374/j.issn1001-053x.2014.02.011

类金刚石薄膜在锥形纳米压头作用下的断裂分析

Fracture analysis of diamond-like carbon films under conical nanoindentation

  • 摘要: 硬薄膜往往具有较脆的特性,在过载时易发生脆性断裂.本文研究了硬薄膜/软基体在锥形纳米压头作用下的断裂模式.利用等离子体化学沉积法在聚二醚酮基体上沉积生成类金刚石薄膜.使用纳米压痕法对其进行实验研究,实时记录纳米压头压入样品过程中所受的载荷以及位移.载荷位移曲线中有若干间断点,代表着裂纹的形成和扩展.压痕实验完成后,通过扫描电子显微镜和聚焦离子束观察发现,类金刚石薄膜压痕处出现规则的贯穿厚度的环形裂纹和径向裂纹.最后,利用有限元法分析了硬薄膜/软基体在锥形压头作用下的应力分布,通过cohesive单元模拟环形裂纹的起始和扩展.结果表明:环形裂纹是由薄膜表面较高的径向拉应力引起的,较高的径向拉应力发生于压头和薄膜表面接触区域的外侧;径向裂纹则是由薄膜在界面附近较大的拉应力引起的.并且,各圈环形裂纹的半径基本呈线性递增,这和实验观测基本相符.

     

    Abstract: This article reports fracture in hard films on a soft substrate under conical indentation. A diamond-like carbon (DLC) film was deposited onto a poly-ether-ether-ketone (PEEK) substrate using plasma chemical vapor deposition. Nanoindentation was performed on the film surface, in the meanwhile, load and depth data were recorded, and ‘pop-in’, correlated with crack formation, was found in load-depth curves. Ring cracks and radial cracks in the film were observed by scanning electron microscopy and focused ion beam method after indentation. Finally, finite element analysis using cohesive elements was conducted to study the stress distribution of the hard film/soft substrate. It is found that ring cracks in the thin film are induced by high tensile radial stress on the film surface outside the contact region of the indenter, while radial cracks are caused by high tensile stress on the thin film near the interface. The results also show that the radius of ring cracks increases with the number of ring cracks, which agrees well with experimental observations.

     

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