XPS Study of TiO<sub>2</sub> Coated with CeO<sub>2</sub> Film

Zhang Mei; Liu Zhenxiang; Xie Kan; Du Xueyan; Li Wenchao

doi:10.13374/j.issn1001-053x.1999.04.004

Zhang Mei, Liu Zhenxiang, Xie Kan, Du Xueyan, Li Wenchao. XPS Study of TiO2 Coated with CeO2 Film[J]. Chinese Journal of Engineering, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004

Citation:

Zhang Mei, Liu Zhenxiang, Xie Kan, Du Xueyan, Li Wenchao. XPS Study of TiO2 Coated with CeO2 Film[J]. Chinese Journal of Engineering, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004

Citation:

Zhang Mei, Liu Zhenxiang, Xie Kan, Du Xueyan, Li Wenchao. XPS Study of TiO2 Coated with CeO2 Film[J]. Chinese Journal of Engineering, 1999, 21(4): 331-333. DOI: 10.13374/j.issn1001-053x.1999.04.004

XPS Study of TiO₂ Coated with CeO₂ Film

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Redox capacity of CeO₂ coating TiO₂ is discussed.It is showed that CeO₂ is easy to be reduced and can be re-oxidized while expoursing O₂.Due to Ti⁴⁺ mixed in the CeO₂ lattice, the activation energy decrease, which attributed to oxygen vacancy migration.

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XPS Study of TiO2 Coated with CeO2 Film

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XPS Study of TiO₂ Coated with CeO₂ Film