Effects of the thickness and deposition rate of Ta seed layer on the anisotropic mag-netoresistance and coercivity of Ta/Ni65Co35 bilayers
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Abstract
The effects of the thickness and deposition rate of Ta seed layer on the anisotropic magnetoresistance (AMP.) and coercivity ofTa/Ni65Co35 bilayers were investigated. The results showed that △ρ/ρ of Ta/Ni65Co35 bilayers could be improved at a certain thickness or higher deposition rate. The coercivity of Ta/Ni65Co35 films increased with the use of Ta seed layer. But the effect of the deposition rate on the coercivity of Ta/Ni65Co35 films was not significant.
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